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Magazine Name : Ieee Design And Test Of Computers

Year : 1999 Volume number : 16 Issue: 01

Itc Keynote: Test In The Emerging Intellectual Property Business. (Article)
Subject: Design & Test Of Computers , Itc Keynote:
Author: Robin Saxby      Peter Harrod     
page:      16 - 18
Guest Editors' Introduction:Dram Architecture And Testing. (Article)
Subject: Design & Test Of Computers , Guest Editors' Introduction
Author: Bruce F.Cockburn      Fabrizio Lombardi      Fred J.Meyer     
page:      19 - 21
Faults Models And Test For A 2-Bit-Per-Cell Mldram. (Article)
Subject: Design & Test Of Computers , Fault Models
Author: Michael Redeker      Bruce F.Cockburn      Duncan G.Elliott     
page:      22 - 31
Computational Ram: Implementing Processors In Memory. (Article)
Subject: Design & Test Of Computers , Computational Ram
Author: Duncan G.Elliott      Michael Stumm      W.Martin Snelgrove      Christian Cojocaru     
page:      32 - 41
Two High-Bandwidh Memory Bus Structures. (Article)
Subject: Design & Test Of Computers , Two High-Bandwidth
Author: Bruce Millar      Peter Gillingham     
page:      42 - 52
Universal Test Interface For Embedded-Dram Testing. (Article)
Subject: Design & Test Of Computers , Universal Test Interface
Author: Shinji Miyano      Katsuhiko Sato      Kenji Numata     
page:      53 - 58
A Programmable Bist Core For Embadded Dram. (Article)
Subject: Design & Test Of Computers , A Programmable
Author: Chih-Tsun Huang      Jing-Reng Huang      Chi-Feng Wu      Cheng-Wen Wu     
page:      59 - 70
Estimating The Economic Benefits Of Dft. (Article)
Subject: Design & Test Of Computers , Estimating The Economic
Author: Kenneth M.Butler     
page:      71 - 79